Coupled Thermal and Thermo-Mechanical Design Assessment of High Power Light Emitting Diode

被引:14
|
作者
Han, Bongtae [1 ]
Jang, Changsoo [1 ]
Bar-Cohen, Avram [1 ]
Song, Bongmin [1 ]
机构
[1] Univ Maryland, Dept Mech Engn, College Pk, MD 20742 USA
关键词
Junction temperature; light emitting diode (LED); thermal management; thermal stresses; LED PACKAGE; DELAMINATION; UNDERFILL; OPERATION; JUNCTION;
D O I
10.1109/TCAPT.2010.2044413
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Coupled thermal and mechanical design issues in a high power light emitting diode (LED) package platform are investigated using numerical models. A thermal resistance network model and a 3-D finite element model are built for thermal and stress analyses. They are validated with the experimental data and subsequently utilized to study the effect of key parameters on the junction temperature and the thermal strains. An extensive parametric analysis is conducted to assess the effect of design and material parameters on the junction temperature and thermal strains of the high power LED under study. Based on the results, the desired parameters of adhesives for high power LED applications are identified and an example of an LED thermo-mechanical design protocol is presented.
引用
收藏
页码:688 / 697
页数:10
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