Laser interferometer for absolute distance measurement based on a tunable VCSEL laser

被引:1
|
作者
Cip, O [1 ]
Mikel, B [1 ]
Lazar, J [1 ]
机构
[1] Acad Sci Czech Republ, Inst Sci Instruments, CS-61264 Brno, Czech Republic
关键词
wavelength-scanning interferometry; absolute interferometry; tunable laser; scale linearity;
D O I
10.1117/12.611685
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In the work, we present the absolute distance interferometer with a narrow-linewidth tunable VCSEL laser (Vertical-Cavity Surface-Emitting Laser) working at lambda = 760 nm. As a detection technique, we use a fast wavelength-scanning interferometry improved by a amplitude division of the interference fringe with using two signals in quadrature. Used VCSEL laser is wide tunable with the mod-hop free tuning range more than 1.2 nm by means of the amplitude modulation of the injection current. We control the stabilization and tuning process of the laser wavelength with using the frequency lock to a Fabry-Perot resonator. We build that resonator as a glass plan-parallel etalon with high-fines. Except the frequency lock, the etalon helps us to measure a wavelength-tuning interval of VCSEL laser during the scanning process. We have stabilized an operating temperature of the VCSEL laser by means of a fast digital temperature controller. The optical set-up of the interferometer begins with a polarizing beam-sputter. It splits the laser beam into the measuring and reference arm of the Michelson interferometer. Two cubic corner cubes reflect beams back to this beam-splitter. It collects reflected beams to the same axis of propagation. Then a detection unit produces the combination of two perpendicularly polarized laser beams with production of two electronic signals that are in the quadrature. A fast analog-to-digital card equipped with the digital signal processor (DSP) samples these signals. DSP also controls the course of the scanning process. After AA = 1 nm scan of the wavelength of VCSEL laser we obtain a record of passed interference fringes and passed Fabry-Perot resonance modes at the same time. On basis of these measured quantities we are able to calculate with high precision the instantaneous value of the optical path length difference between the measuring and reference arm of the Michelson interferometer. We experimentally compared the developed absolute interferometer with a conventional - incremental Michelson interferometer based on a single frequency He-Ne laser that has the resolution 1.2 nm. We achieved the relative uncertainty and scale linearity below 8 x 10(-5) for range of tested distances L is an element of < 78; 118 > mm. The interferometer is able to work as the conventional interferometer too in case the wavelength of the VCSEL laser is locked into the selected resonance mode of the Fabry-Perot resonator.
引用
收藏
页码:246 / 251
页数:6
相关论文
共 50 条
  • [1] Diode laser interferometer for absolute distance measurement
    Burgarth, V
    Zhang, C
    Abou-Zeid, A
    [J]. TECHNISCHES MESSEN, 2003, 70 (02): : 53 - 58
  • [2] Tunable laser diode for absolute distance measurement
    Hafidi, A
    Pffeifer, P
    Meyrueis, P
    [J]. LASER INTERFEROMETRY IX: APPLICATIONS, 1998, 3479 : 339 - 344
  • [3] Pulsed laser diode optical fiber interferometer absolute distance measurement
    Wang, CH
    Xiao, H
    Hong, HT
    Ye, SH
    [J]. FIBER OPTIC AND LASER SENSORS XIV, 1996, 2839 : 350 - 353
  • [4] MEASUREMENT OF ABSOLUTE DISTANCE EMPLOYING A TUNABLE CW DYE-LASER
    IKEZAWA, K
    ISOZAKI, K
    OGITA, E
    UEDA, T
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (01) : 36 - 39
  • [5] Absolute distance interferometer with grating-stabilized tunable diode laser at 633 nm
    Kinder, T
    Salewski, KD
    [J]. JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 2002, 4 (06): : S364 - S368
  • [6] Photon-counting laser interferometer for absolute distance measurement on rough surface
    Pang, Chengkai
    Wu, Di
    Shi, Haotian
    Chen, Xiuliang
    Yang, Lei
    Li, Zhaohui
    Wu, Guang
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (08):
  • [7] Absolute distance measurements with tunable semiconductor laser
    Mikel, B
    Cíp, O
    Lazar, J
    [J]. PHYSICA SCRIPTA, 2005, T118 : 41 - 44
  • [8] Absolute distance measurement in a combined-dispersive interferometer using a femtosecond pulse laser
    Wu, Hanzhong
    Zhang, Fumin
    Meng, Fei
    Liu, Tingyang
    Li, Jianshuang
    Pan, Liang
    Qu, Xinghua
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2016, 27 (01)
  • [9] Measurement of absolute strain based on a tunable cw semiconductor laser
    Li, CC
    Lu, ZH
    Luo, F
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 2000, 80 (01) : 31 - 34
  • [10] ABSOLUTE AND NON-TOUCH LENGTH MEASUREMENT BASED ON A LASER INTERFEROMETER
    DOBOSZ, M
    [J]. MECHANIK MIESIECZNIK NAUKOWO-TECHNICZNY, 1980, 53 (11): : 597 - 599