Local structure and electronic properties in colossally magnetoresistive thin film of La0.87Na0.13MnO3 by Mn-K edge EXAFS and XANES

被引:0
|
作者
Ghigna, P
Marzola, A
Amantea, R
Malavasi, L
Flor, G
D'Acapito, F
Bardelli, F
Mozzati, MC
机构
[1] Univ Pavia, Dipartimento Chim Fis M Rolla, I-27100 Pavia, Italy
[2] CNR, INSTM, IENI, Unita Pavia, I-27100 Pavia, Italy
[3] European Synchrotron Radiat Facil, GILDA, CRG, F-38043 Grenoble, France
[4] Univ Pavia, Unita Pavia, INFM, Dipartimento Fis A Volta, I-27100 Pavia, Italy
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 238卷 / 1-4期
关键词
manganites; thin films; dead layer; XAFS;
D O I
10.1016/j.nimb.2005.06.055
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Mn-K edge EXAFS and XANES spectra of La0.87Na0.13MnO3 manganite films with different thicknesses (750, 250, 125 and 50 angstrom), have been acquired at RT. In the 50 angstrom film a shift of the Fermi level downward in energy is found if compared to the other films. In addition, the density of the empty minority spin states is decreased. This finding has been attributed to the presence of some Mn ions experiencing a different local chemical environment that results in the breaking of some DE paths, and in addition to an Anderson localisation of the charge carriers. This last conclusion can explain both the strongly insulating nature and the spin glass like behaviour of the magnetic response of the 50 angstrom film, and has been corroborated by the results of the EXAFS analysis. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:242 / 247
页数:6
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