Inverse scattering for the penetrable ellipsoid and ellipsoidal boss

被引:7
|
作者
Dassios, G [1 ]
机构
[1] INST CHEM ENGN & HIGH TEMP CHEM PROC,GR-26500 PATRAI,GREECE
来源
关键词
D O I
10.1121/1.415370
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
The inverse scattering problem for low-frequency plane-wave excitation of either a penetrable ellipsoid specified by its relative mass density and relative compressibility, or the corresponding ellipsoidal boss on a rigid base plane, is considered. For either situation, scatterer shape and orientation, as well as one of the constitutive parameters, may be obtained from a finite number of measurements of the leading order term in the low-frequency expansion of the scattering amplitude. Rayleigh's result for this O(k(3)) contribution provides the analytical expression needed for the data inversion. (C) 1996 Acoustical Society of America.
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页码:1877 / 1882
页数:6
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