Strain relaxation in thin films of Cu grown on Ni(001)

被引：0
|
作者：
Rasmussen, FB [1 ]
Baker, J
Nielsen, M
Feidenhans'l, R
Johnson, RL
机构：
[1] Riso Natl Lab, Condensed Matter Phys & Chem Dept, DK-4000 Roskilde, Denmark
[2] Univ Hamburg, Inst Expt Phys 2, D-22761 Hamburg, Germany
来源：
PHYSICA B | 1998年 / 248卷
关键词：
strain relaxation; nanoclusters; X-ray diffraction;
D O I：
暂无
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (111) facets formed in thin Cu films when grown on Ni(001). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：34 / 38
页数：5
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