Temperature Effects and Optical Emission Spectroscopy Studies of Hydrogen-Based Plasma Etching of Copper

被引:18
|
作者
Wu, Fangyu [1 ]
Levitin, Galit [1 ]
Hess, Dennis W. [1 ]
机构
[1] Georgia Inst Technol, Sch Chem & Biomol Engn, Atlanta, GA 30332 USA
基金
美国国家科学基金会;
关键词
CU FILMS; LIGHT IRRADIATION; THIN-FILM; CHLORINE; RESISTIVITY; DIAGNOSTICS; MECHANISM; DISCHARGE; HYDRIDE;
D O I
10.1149/2.015202jes
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Optical emission spectroscopy (OES) and substrate temperature variation studies have been performed on Cu etch processes based on hydrogen (H-2) plasmas. Temperature was varied between -150 degrees C and 100 degrees C. Gas phase Cu emission was detected during the H-2 plasma etch processes. The correlation between Cu etch rate and Cu emission intensity trends as a function of temperature suggests that the Cu removal mechanism changes over the temperature range investigated. The hydrogen-Cu interaction chemistry plays a critical role in the etch process, suggesting that copper hydrides are likely etch products. (C) 2011 The Electrochemical Society. [DOI: 10.1149/2.015202jes] All rights reserved.
引用
收藏
页码:H121 / H124
页数:4
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