Impact of KF Post-Deposition Treatment on Aging of the Cu(In,Ga)Se2 Surface and Its Interface with CdS

被引:15
|
作者
Nicoara, Nicoleta [1 ]
Harel, Sylvie [2 ]
Lepetit, Thomas [2 ]
Arzel, Ludovic [2 ]
Barreau, Nicolas [2 ]
Sadewasser, Sascha [1 ]
机构
[1] Int Iberian Nanotechnol Lab INL, P-4715330 Braga, Portugal
[2] Univ Nantes, CNRS, UMR6502, Inst Mat Jean Rouxel IMN, 2 Rue Houssiniere,BP 32229, F-44322 Nantes 3, France
来源
ACS APPLIED ENERGY MATERIALS | 2018年 / 1卷 / 06期
关键词
chalcopyrite; thin-film solar cells; alkali fluoride postdeposition treatments Kelvin probe force microscopy; photoelectron spectroscopy; X-RAY PHOTOELECTRON; FILM SOLAR-CELLS; THIN-FILMS; DEPOSITION; ABSORBERS; STABILITY; ELEMENTS;
D O I
10.1021/acsaem.8b00365
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Recent world record efficiencies for thin film solar cells based on Cu(In,Ga)Se-2 (CIGS) have been realized with absorbers subject to alkali fluoride post deposition treatments (PDT). We investigated the effect of ambient air exposure on the electronic properties of CIGS with KF-PDT in a combined time-dependent Kelvin probe force microscopy and X-ray photoelectron spectroscopy study. We also studied the early stage formation of the absorber/buffer interface after the initial deposition of CdS in the chemical bath. Our study shows that the KF-PDT, as well as the CdS deposition process induce an increase in the overall surface work function, as compared to bare CIGS. A K-In-Se compound forms after the KF-PDT, accompanied by a stable In oxide which explains the remarkable stability of the contact potential difference to air exposure, confirming phenomenological observations in many laboratories. In clear contrast to the untreated CIGS, the KF-treated CIGS/CdS interface shows a significant variation in the surface potential (similar to 360 mV) over approximately 7 h air-exposure. We attribute this variation to a Cd-In intermixing at interface, whose chemical stability is susceptible to air-exposure. Our results contribute to the understanding of the electronic properties of the KF-treated and untreated CIGS/CdS junction during the early stages of the interface formation, which impact the overall device properties.
引用
收藏
页码:2681 / 2688
页数:15
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