Fourier-transform profilometry using a pulse-encoded fringe pattern

被引：0
|
作者：
Su, Wei-Hung [1 ]
Liu, Zhi-Hsiang [1 ]
机构：
[1] Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 804, Taiwan
来源：
PHOTONIC FIBER AND CRYSTAL DEVICES: ADVANCES IN MATERIALS AND INNOVATIONS IN DEVICE APPLICATIONS XIII | 2019年 / 11123卷
关键词：
phase unwrapping; fringe analysis; fringe projection; projected fringe profilometry; optical inspection; OBJECTS; PROJECTION; COLOR; DEPTH;
D O I：
10.1117/12.2530715
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A one-shot technique for profile measurements is presented. A sinusoidal fringe pattern embedded with one-dimensional pulses is used to illuminate the inspected object. The pattern projected on the inspected object is observed by a CCD camera at another view angle. The pulse-encoded fringe pattern provides additional information to identify the fringe order. Even though the surface color or reflectivity varies periodically with positions, it distinguishes the fringe order very well.
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页数：7
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