Numerical Modeling of the Field Emission Nanoscale Stand-Alone Devices for Conversion of Thermal Energy (T ∼ 300K) to Electrical Energy

被引：0

作者：

Ptitsin, V. E. ^{[1
]}

机构：

[1] Russian Acad Sci, Inst Analyt Instrumentat, St Petersburg, Russia

来源：

2015 28TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC) | 2015年

关键词：

energy conversion; thermal field electron emission; nanostructures; nanotubes; quantum dots;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

New thermal field electron emission energy conversion method for vacuum electron-optical systems (EOS) with a nanostructured surface electron sources is developed. Physical and numerical modeling of an electron emission and transport processes for different EOS was carried out. Studies have shown that nanoscale thermal field emission EOS can be used to design and create stand-alone devices converting environmental thermal energy (T similar to 300K) into electrical energy.

引用

页码：34 / U279

页数：3

共 9 条

[1] Thermal Field Emission Converter of an Environmental Thermal (T ∼300k) Energy - to Electrical Energy
Ptitsin, V. E.
2014 TENTH INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE (IVESC), 2014,
[2] Physical and Numerical Modeling of the Stand-Alone Nanoscale Electrical Energy Generator Operating On the Bases of Abnormal Thermal Field Emission Phenomenon at Room Temperature
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[3] Thermal and electrical energy transport and conversion in nanoscale electron field emission processes
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[7] Thermal-to-Electrical Energy Conversion on the Bases of Thermal Field Electron Emission Phenomenon
Ptitsin, V. E.
2015 28TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), 2015, : 244 - 245
[8] New Approach to Thermal-to-Electrical Energy Conversion Problem on the Bases of the Thermal Field Electron Emission Phenomenon
Ptitsin, V. E.
2014 TENTH INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE (IVESC), 2014,
[9] New Approach to Thermal-to-Electrical Energy Conversion Problem on the Bases of the Thermal Field Electron Emission Phenomenon
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2014 2ND INTERNATIONAL CONFERENCE ON EMISSION ELECTRONICS (ICEE), 2014, : 75 - 77

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