Ion Beam Figuring of silicon aspheres

被引:4
|
作者
Demmler, Marcel [1 ]
Zeuner, Michael [1 ]
Luca, Alfonz [1 ]
Dunger, Thoralf [1 ]
Rost, Dirk [1 ]
Kiontke, Sven [2 ]
Krueger, Marcus [2 ]
机构
[1] Roth & Rau MircoSyst GmbH, Gewerbering 3, D-09337 Hohenstein Ernstt, Germany
[2] Asphericon GmbH, D-07745 Jena, Germany
来源
关键词
Ion Beam Figuring; Ion Beam Trimming; silicon lens; high precision; aspheres; fine polishing; finishing;
D O I
10.1117/12.873787
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Silicon lenses are widely used for infrared applications. Especially for portable devices the size and weight of the optical system are very important factors. The use of aspherical silicon lenses instead of spherical silicon lenses results in a significant reduction of weight and size. The manufacture of silicon lenses is more challenging than the manufacture of standard glass lenses. Typically conventional methods like diamond turning, grinding and polishing are used. However, due to the high hardness of silicon, diamond turning is very difficult and requires a lot of experience. To achieve surfaces of a high quality a polishing step is mandatory within the manufacturing process. Nevertheless, the required surface form accuracy cannot be achieved through the use of conventional polishing methods because of the unpredictable behavior of the polishing tools, which leads to an unstable removal rate. To overcome these disadvantages a method called Ion Beam Figuring can be used to manufacture silicon lenses with high surface form accuracies. The general advantage of the Ion Beam Figuring technology is a contactless polishing process without any aging effects of the tool. Due to this an excellent stability of the removal rate without any mechanical surface damage is achieved. The related physical process - called sputtering - can be applied to any material and is therefore also applicable to materials of high hardness like Silicon (SiC, WC). The process is realized through the commercially available ion beam figuring system IonScan 3D. During the process, the substrate is moved in front of a focused broad ion beam. The local milling rate is controlled via a modulated velocity profile, which is calculated specifically for each surface topology in order to mill the material at the associated positions to the target geometry. The authors will present aspherical silicon lenses with very high surface form accuracies compared to conventionally manufactured lenses.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] Ion beam figuring of CVD silicon carbide mirrors
    Gailly, P
    Collette, JP
    Frenette, KF
    Jamar, C
    [J]. PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON SPACE OPTICS (ICSO 2004), 2004, 554 : 691 - 697
  • [2] Influence of Ion Beam Figuring(IBF) on reflectivity of monocrystalline silicon
    Gang, Zhou
    Ye, Tian
    Feng, Shi
    Ci, Song
    Hang, Yuan
    Zhong Yaoyu
    [J]. SECOND TARGET RECOGNITION AND ARTIFICIAL INTELLIGENCE SUMMIT FORUM, 2020, 11427
  • [3] Polishing silicon modification layer on silicon carbide surface by ion beam figuring
    Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun
    130033, China
    [J]. Chin. Opt. Lett.,
  • [4] Ion beam figuring machine for ultra-precision silicon spheres correction
    Arnold, Thomas
    Pietag, Fred
    [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2015, 41 : 119 - 125
  • [5] Ion beam figuring for lithography optics
    Weiser, Martin
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (8-9): : 1390 - 1393
  • [6] Machining reachability in ion beam figuring
    Zhou, Lin
    Dai, Yi-Fan
    Xie, Xu-Hui
    Jiao, Chang-Jun
    Li, Sheng-Yi
    [J]. Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2007, 15 (02): : 160 - 166
  • [7] Obliquely incident ion beam figuring
    Zhou, Lin
    Dai, Yifan
    Xie, Xuhui
    Li, Shengyi
    [J]. OPTICAL ENGINEERING, 2015, 54 (10)
  • [8] Optimum removal in ion-beam figuring
    Zhou, Lin
    Dai, Yifan
    Xie, Xuhui
    Li, Shengyi
    [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2010, 34 (03): : 474 - 479
  • [9] Dwell time algorithm in ion beam figuring
    Wu, Jian Fen
    Lu, Zhen Wu
    Zhang, Hong Xin
    Wang, Tai Sheng
    [J]. APPLIED OPTICS, 2009, 48 (20) : 3930 - 3937
  • [10] Ion Beam Figuring Using Einzel Lens
    Karabyn, Vasyl
    Polak, Jaroslav
    Prochaska, Frantisek
    Melich, Radek
    [J]. OPTICS AND MEASUREMENT INTERNATIONAL CONFERENCE 2019, 2019, 11385