Study of materials in the semi-solid state

被引：0

作者：

Verrier, S ^{[1
]}

Braccini, M ^{[1
]}

Josserond, C ^{[1
]}

Salvo, L ^{[1
]}

Suéry, M ^{[1
]}

Ludwig, W ^{[1
]}

Cloetens, P ^{[1
]}

Baruchel, J ^{[1
]}

机构：

[1] Univ Grenoble 1, ENSPG, F-38402 St Martin Dheres, France

来源：

X-RAY TOMOGRAPHY IN MATERIAL SCIENCE | 2000年

关键词：

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A synchrotron X-ray source (ESRF, FRANCE), has been used to investigate the microstructure of semi-solid materials. Two kinds of materials have been investigated, Al-Cu alloys with a high volume fraction of solid to study hot tearing and an industrial 356 alloy (Al-Si) which is the common material used for semisolid forming. Two imaging modes have been used, the absorption mode for the Al-Cu material and the phase contrast mode for the Al-Si. Discussion is presented on the interest of such a technique to characterise semi-solid microstructures.

引用

页码：77 / 87

页数：11

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