Tip Charge Dependence of Three-Dimensional AFM Mapping of Concentrated Ionic Solutions

被引:23
|
作者
Benaglia, Simone [1 ]
Uhlig, Manuel R. [1 ]
Hernandez-Munoz, Jose [2 ]
Chacon, Enrique [1 ]
Tarazona, Pedro [2 ]
Garcia, Ricardo [1 ]
机构
[1] CSIC, Inst Ciencia Mat Madrid, Madrid 28049, Spain
[2] Univ Autonoma Madrid, IFIMAC Condensed Matter Phys Ctr, Dept Fis Teor Mat Condensada, Madrid 28049, Spain
关键词
ATOMIC-FORCE MICROSCOPY; LIQUID; MOLECULES; SURFACE; WATER; POTENTIALS;
D O I
10.1103/PhysRevLett.127.196101
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A molecular scale understanding of the organization and structure of a liquid near a solid surface is currently a major challenge in surface science. It has implications across different fields from electrochemistry and energy storage to molecular biology. Three-dimensional AFM generates atomically resolved maps of solid-liquid interfaces. The imaging mechanism behind those maps is under debate, in particular, for concentrated ionic solutions. Theory predicts that the observed contrast should depend on the tip's charged state. Here, by using neutrally, negatively, and positively charged tips, we demonstrate that the 3D maps depend on the tip's polarization. A neutral tip will explore the total particle density distribution (water and ions) while a charged tip will reveal the charge density distribution. The experimental data reproduce the key findings of the theory.
引用
收藏
页数:6
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