XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam

被引：2
|
作者：
Dietrich, Paul M. [1 ]
Nietzold, Carolin [1 ]
Weise, Matthias [1 ]
Unger, Wolfgang E. S. [1 ]
Alnabulsi, Saad [2 ]
Moulder, John [2 ]
机构：
[1] Fed Inst Mat Res & Testing, D-12200 Berlin, Germany
[2] Physical Elect Inc, 17825 Lake Dr East, Chanhassen, MN 55317 USA
来源：
BIOINTERPHASES | 2016年 / 11卷 / 02期
关键词：
SURFACES; QUANTIFICATION;
D O I：
10.1116/1.4948341
中图分类号：
Q6 [生物物理学];
学科分类号：
071011 ;
摘要：
The growing interest in artificial bioorganic interfaces as a platform for applications in emerging areas as personalized medicine, clinical diagnostics, biosensing, biofilms, prevention of biofouling, and other fields of bioengineering is the origin of a need for in detail multitechnique characterizations of such layers and interfaces. The in-depth analysis of biointerfaces is of special interest as the properties of functional bioorganic coatings can be dramatically affected by in-depth variations of composition. In worst cases, the functionality of a device produced using such coatings can be substantially reduced or even fully lost. (C) 2016 American Vacuum Society.
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页数：5
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