Microstructural and Transport Characterization of Co2MnSi Thin Films

被引：1
|
作者：
Pandey, Himanshu [1 ]
Kumar, Manoj [1 ]
Srivastava, Avanish K. [2 ]
Pandey, S. [3 ]
机构：
[1] Jaypee Inst Informat Technol, Dept Phys & Mat Sci & Engn, Noida 201309, Uttar Pradesh, India
[2] CSIR Adv Mat & Proc Res Inst, Bhopal 462024, Madhya Pradesh, India
[3] Natl Inst Technol Jamshedpur, Dept Phys, Jamshedpur 831014, Jharkhand, India
来源：
NATIONAL CONFERENCE ON ADVANCED MATERIALS AND NANOTECHNOLOGY (AMN-2018) | 2018年 / 2009卷
关键词：
MAGNETOTRANSPORT PROPERTIES;
D O I：
10.1063/1.5052098
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We report structural and transport characterization on laser ablated full-Heusler alloy thin films of Co2MnSi grown on single crystalline (001) oriented SrTiO3 substrate. High resolution microstructural analysis reveals ultrafine-grained microstructure, where the individual grains are single crystalline with well oriented morphologies. The presence of the superlattice as well as fundamental diffraction peaks confirms the L2(1) ordering of the crystal structure. The temperature dependence of resistivity shows peculiar behaviour by showing a very low value of residual resistivity small similar to 0.15 mu Omega-cm. For thinner films, the resistivity is characterized by a minimum followed by square-root temperature dependence due to interference of the interaction between conduction electrons and their elastic scattering by static inhomogeneities.
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页数：4
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