Recent progress in high frequency electron cyclotron resonance ion sources

被引:0
|
作者
Hitz, D. [1 ]
机构
[1] Commissariat Energie Atom, Dept Rech Fondamentale Mat Condensee, Serv Basses Temp, F-38054 Grenoble 9, France
关键词
ECR plasmas; ECR ion sources; EUV lithography;
D O I
暂无
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
As they are first optimized for their ion losses, ECRISs are always under a fundamental compromise: having high losses and strong confinement at the same time. To help ECR ion source developers in the design or improvement of existing machines, general comments are presented in a review article being soon published. In this 160 pages contribution, fundamental aspects of ECRISs are presented, with a discussion of electron temperature and confinement and ion confinement. Then, as microwaves play a key role in these machines, a chapter presents major guidelines for microwave launching and coupling to ECR plasma. Moreover, once ECR plasma is created, understanding this plasma is important in ion sourcery; and a section is dedicated to plasma diagnostics with an emphasis on the determination of electron and ion density and temperature by vacuum ultraviolet (VUV) spectroscopy. Another chapter deals with the role of magnetic confinement and presents updated scaling laws. Next chapter presents different types of ECRISs designed according to the main parameters previously described. Finally, some industrial applications of ECRISs and ECR plasmas in general are presented like ion implantation and photon lithography. Some hints taken from this review article are presented in the following article.
引用
收藏
页码:123 / 127
页数:5
相关论文
共 12 条
  • [1] PRODUCTION OF MULTIPLY CHARGED XENON IONS
    APARD, P
    BLIMAN, S
    GELLER, R
    JACQUOT, B
    JACQUOT, C
    [J]. PHYSICS LETTERS A, 1973, A 44 (06) : 432 - 434
  • [2] SOURCE D IONS MULTICHARGES POUR VAPEURS METALLIQUES
    BLIMAN, S
    DOUSSON, S
    FREMION, L
    GELLER, R
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 148 (02): : 213 - 216
  • [3] DELAUNAY M, Patent No. 0550724
  • [4] HITZ D, 2004, 3 INT S EUV LIGHT MI
  • [5] HITZ D, 2002, P 15 INT WORKSH ECR, P53
  • [6] HITZ D, Patent No. 0551256
  • [7] HITZ D, 2005, P 16 ECRIS WORKSH AI, V49, P123
  • [8] HITZ D, 2005, Patent No. 2005046296
  • [9] HITZ D, Patent No. 0503421
  • [10] Results with the superconducting electron cyclotron resonance ion source VENUS (invited)
    Lyneis, CM
    Leitner, D
    Abbott, SR
    Dwinell, RD
    Leitner, M
    Silver, CS
    Taylor, C
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (05): : 1389 - 1393