Statistical analysis of degradation modes and mechanisms in various thin-film photovoltaic module technologies

被引：0
|
作者：
Schneller, Eric [1 ]
Shiradkar, Narendra S. [1 ]
Pereira, Camila L. [1 ]
Fonseca, Leandro C. [1 ]
Dhere, Neelkanth G. [1 ]
机构：
[1] Univ Cent Florida, Florida Solar Energy Ctr, Cocoa, FL 32922 USA
来源：
RELIABILITY OF PHOTOVOLTAIC CELLS, MODULES, COMPONENTS, AND SYSTEMS VII | 2014年 / 9179卷
关键词：
Thin-film Solar Cells; Photovoltaics; Reliability;
D O I：
10.1117/12.2060727
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
PV arrays of various thin film modules technologies such as CIGS, rigid single-junction amorphous Silicon (glass-to-glass package) and flexible triple-junction amorphous Silicon have been deployed for over 10 years in hot and humid climate at Florida Solar Energy Center. The performance of selected modules from each array was characterized using visual inspection, dark I-V, flasher I-V, electroluminescence and infrared imaging techniques. Performance was evaluated to determine which, if any, degradation mechanisms are a concern for the long-term reliability of this technology.
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页数：6
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