Buildup of the InSe/M interface (M = Pd, Au) studied by X-ray photoemission and X-ray absorption spectroscopy

被引:6
|
作者
Sanchez-Royo, J. F.
Pellicer-Porres, J.
Segura, A.
Gilliland, S. J.
Safonova, O.
Chevy, A.
机构
[1] Univ Valencia, ICMUV, E-46100 Valencia, Spain
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[3] Univ Paris 06, Lab Phys Milieux Condenses, F-75252 Paris 05, France
关键词
X-ray photoemission; metal-semiconductor interfaces; layered compounds; Schottky interfaces; reactivity;
D O I
10.1016/j.susc.2007.04.005
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The electronic properties of InSe/M (M = Pd, Au) interfaces have been studied by X-ray photoemission measurements. For the InSe/Pd interface, it has been found that Pd atoms diffuse into the InSe lattice at early stages of Pd coverage, acting as acceptor centers. As the Pd coverage increases, a Pd-InSe reaction determines the electronic behaviour of the interface. However, for Pd coverages higher than 1 ML, the barrier formation tends to be controlled by an emerging bulklike Pd overlayer. Despite the atomic structure of this system is far from that expected for an ideal Schottky one, the final electronic barrier value is close to that expected for an abrupt InSe/Pd Schottky interface. On the contrary, the InSe/Au system appeared to behave as a quasi-ideal abrupt Schottky interface. Annealing processes performed at temperatures higher than 600 K alter this scheme, as revealed by X-ray absorption spectroscopy measurements, enhancing diffusion of An atoms into InSe. In any case, the electronic barrier results to be determined by the Au overlayer formed. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:3778 / 3783
页数:6
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