Factors in degradation of multilayer ceramic chip capacitors with nickel electrodes

被引：0
|
作者：
Sumita, S [1 ]
机构：
[1] TDK Corp, Chiba 272, Japan
来源：
MANUFACTURING OF ELECTRONIC MATERIALS AND COMPONENTS | 1998年 / 90卷
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D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Degradation factors of Ni-electrode chip capacitors, such as oxygen vacancies, grain boundary phase, and additives/impurities, are discussed.
引用
收藏
页码：165 / 178
页数：14
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