X-rays to study, induce, and pattern structures in sol-gel materials

X-rays investigations have been shown to reveal important information regarding material features and the formation mechanism of mesostructured materials. Small angle X-ray scattering (SAXS) analysis performed using a synchrotron source has been very important in the optimization of the organization of mesoporous coatings obtained by evaporation induced self-assembly (EISA). The interaction between X-rays and ordered mesoporous films has only recently been reported, and new knowledge has been developed to use this external radiation source to tune the local material properties. Here we discuss the recent developments in X-ray lithography combined with sol-gel synthesis to pattern mesostructured and hierarchical porous coatings including the ability to tailor functionalized surfaces.