Development of a spatially resolving x-ray crystal spectrometer for measurement of ion-temperature (Ti) and rotation-velocity (v) profiles in ITER

被引：26

作者：

Hill, K. W. ^{[1
]}

Bitter, M. ^{[1
]}

Delgado-Aparicio, L. ^{[1
]}

Johnson, D. ^{[1
]}

Feder, R. ^{[1
]}

Beiersdorfer, P. ^{[2
]}

Dunn, J. ^{[2
]}

Morris, K. ^{[2
]}

Wang, E. ^{[2
]}

Reinke, M. ^{[3
]}

Podpaly, Y. ^{[3
]}

Rice, J. E. ^{[3
]}

Barnsley, R. ^{[4
]}

O'Mullane, M. ^{[5
]}

Lee, S. G. ^{[6
]}

机构：

[1] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA

[2] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[3] MIT Plasma Sci & Fus Ctr, Cambridge, MA 02139 USA

[4] Cadarache Ctr, ITER Cadarache JWS, F-13108 St Paul Les Durance, France

[5] Univ Strathclyde, Dept Phys, Glasgow G4 0NG, Lanark, Scotland

[6] Natl Fus Res Inst, Taejon 305333, South Korea

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 10期

关键词：

D O I：

10.1063/1.3492414

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Imaging x-ray crystal spectrometer (XCS) arrays are being developed as a US-ITER activity for Doppler measurement of T-i and v profiles of impurities (W, Kr, and Fe) with similar to 7 cm (a/30) and 10-100 ms resolution in ITER. The imaging XCS, modeled after a prototype instrument on Alcator C-Mod, uses a spherically bent crystal and 2D x-ray detectors to achieve high spectral resolving power (E/dE>6000) horizontally and spatial imaging vertically. Two arrays will measure Ti and both poloidal and toroidal rotation velocity profiles. The measurement of many spatial chords permits tomographic inversion for the inference of local parameters. The instrument design, predictions of performance, and results from C-Mod are presented. (C) 2010 American Institute of Physics. [doi:10.1063/1.3492414]

引用

页数：4

共 20 条

[1] A spatially resolving x-ray crystal spectrometer for measurement of ion-temperature and rotation-velocity profiles on the Alcator C-Mod tokamak
Hill, K. W.
Bitter, M. L.
Scott, S. D.
Ince-Cushman, A.
Reinke, M.
Rice, J. E.
Beiersdorfer, P.
Gu, M. -F.
Lee, S. G.
Broennimann, Ch.
Eikenberry, E. F.
REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (10):
[2] Inversion techniques to obtain local rotation velocity and ion temperature profiles for the x-ray crystal spectrometer on EAST
林子超
张洪明
王福地
Cheonho BAE
符佳
金仡飞
卢迪安
傅盛宇
李建康
吕波
Plasma Science and Technology, 2023, 25 (09) : 35 - 42
[3] MEASUREMENTS OF RADIAL PROFILES OF THE ION TEMPERATURE AND THE PLASMA ROTATION VELOCITY WITH THE TFTR VERTICAL X-RAY CRYSTAL SPECTROMETER
BITTER, M
HSUAN, H
RICE, JE
HILL, KW
DIESSO, M
GREK, B
HULSE, R
JOHNSON, DW
JOHNSON, LC
VONGOELER, S
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (10): : 2131 - 2134
[4] Inversion techniques to obtain local rotation velocity and ion temperature profiles for the x-ray crystal spectrometer on EAST
林子超
张洪明
王福地
Cheonho BAE
符佳
金仡飞
卢迪安
傅盛宇
李建康
吕波
Plasma Science and Technology, 2023, (09) : 35 - 42
[5] MEASUREMENTS OF RADIAL PROFILES OF THE ION TEMPERATURE AND THE PLASMA ROTATION VELOCITY WITH THE TFTR VERTICAL X-RAY CRYSTAL SPECTROMETER
BITTER, M
HSUAN, H
RICE, JE
HILL, KW
DIESSO, M
GREK, B
HULSE, R
JOHNSON, DW
JOHNSON, LC
VONGOELER, S
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (08): : 1852 - 1852
[6] Inversion techniques to obtain local rotation velocity and ion temperature profiles for the x-ray crystal spectrometer on EAST
Lin, Zichao
Zhang, Hongming
Wang, Fudi
Bae, Cheonho
Fu, Jia
Jin, Yifei
Lu, Di'an
Fu, Shengyu
LI, Jiankang
Lyu, Bo
PLASMA SCIENCE & TECHNOLOGY, 2023, 25 (09)
[7] Spatially Resolved Measurements of Temperature and Rotation Velocity from the Tangential Imaging X-ray Crystal Spectrometer on the EAST Tokamak
Wang, Fudi
Shi, Yuejiang
Zhang, Wei
Fu, Jia
Li, Yingying
Xu, Jingcui
Shen, Yongcai
Lu, Bo
Zhang, Jizong
Wan, Baonian
Lee, Sanggon
Bitter, Manfred
Hill, Kenneth
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2011, 59 (04) : 2734 - 2738
[8] Spatially resolved spectra from a new x-ray imaging crystal spectrometer for measurements of ion and electron temperature profiles (invited)
Bitter, M
Hill, KW
Stratton, B
Roquemore, AL
Mastrovito, D
Lee, SG
Bak, JG
Moon, MK
Nam, UW
Smith, G
Rice, JE
Beiersdorfer, P
Fraenkel, BS
REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (10): : 3660 - 3665
[9] Electron and ion temperature measurement with a new x-ray imaging crystal spectrometer on WEST
Da Ros, A.
Vezinet, D.
Colledani, G.
Fenzi-Bonizec, Christel
Moureau, G.
Bertschinger, G.
REVIEW OF SCIENTIFIC INSTRUMENTS, 2024, 95 (04):
[10] MEASUREMENTS OF THE ION TEMPERATURE AND PLASMA ROTATION FROM K-ALPHA EMISSION WITH THE TFTR HORIZONTAL X-RAY CRYSTAL SPECTROMETER
HSUAN, H
BITTER, M
RICE, JE
HILL, KW
JOHNSON, L
LIEW, SL
SCOTT, SD
VONGOELER, S
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (08): : 1853 - 1853

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