An anomalous diffraction study of Cu2Zn(Ge,Si)Se4

被引:0
|
作者
Toebbens, D. M. [1 ]
Gurieva, G. [1 ]
Niedenzu, S. [1 ]
Schuck, G. [1 ]
Schorr, S. [1 ]
机构
[1] Helmholtz Zentrum Berlin Mat & Energie HZB, Dept Struct & Dynam Energy Mat, Hahn Meitner Pl 1, D-14109 Berlin, Germany
关键词
Kesterite; semiconductor; anomalous scattering; MEAD; cation disorder;
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
PS-36-5
引用
收藏
页码:C1064 / C1064
页数:1
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