Spherical nano-inhomogeneity with the Steigmann-Ogden interface model under general uniform far-field stress loading

An explicit solution, considering the interface bending resistance as described by the Steigmann-Ogden interface model, is derived for the problem of a spherical nano-inhomogeneity (nanoscale void/inclusion) embedded in an infinite linear-elastic matrix under a general uniform far-field-stress (including tensile and shear stresses). The Papkovich-Neuber (P-N) general solutions, which are expressed in terms of spherical harmonics, are used to derive the analytical solution. A superposition technique is used to overcome the mathematical complexity brought on by the assumed interfacial residual stress in the Steigmann-Ogden interface model. Numerical examples show that the stress field, considering the interface bending resistance as with the Steigmann-Ogden interface model, differs significantly from that considering only the interface stretching resistance as with the Gurtin-Murdoch interface model. In addition to the size-dependency, another interesting phenomenon is observed: some stress components are invariant to interface bending stiffness parameters along a certain circle in the inclusion/matrix. Moreover, a characteristic line for the interface bending stiffness parameters is presented, near which the stress concentration becomes quite severe. Finally, the derived analytical solution with the Steigmann-Ogden interface model is provided in the supplemental MATLAB code, which can be easily executed, and used as a benchmark for semi-analytical solutions and numerical solutions in future studies. (C) 2019 Elsevier Ltd. All rights reserved.