Influence of capacitance characteristic on I-V measurement of dye-sensitized solar cells

被引:12
|
作者
Tian, Hanmin [1 ,2 ]
Zhang, Jiyuan [1 ,3 ]
Wang, Xiangyan [1 ,3 ]
Yu, Tao [1 ,3 ]
Zou, Zhigang [1 ,3 ]
机构
[1] Nanjing Univ, Dept Phys, ERERC, Nanjing 210093, Peoples R China
[2] Hebei Univ Technol, Sch Informat, Dept Elect Sci & Technol, Tianjin 300401, Peoples R China
[3] Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
基金
中国国家自然科学基金;
关键词
Dye-sensitized solar cell; Equivalent circuit; Current voltage characteristic; Capacitance characteristic; CONVERSION EFFICIENCY; ELECTRICAL-IMPEDANCE; EQUIVALENT-CIRCUIT; PHOTOCURRENT; PERFORMANCE; FABRICATION;
D O I
10.1016/j.measurement.2011.06.003
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The quantitative analysis, which based on equivalent circuits and parameter estimating, approved the capacitance characteristic of DSSCs caused the fluctuation of the measured efficiency. The equivalent circuit parameter was estimated from a typical dye solar cell, which was characterized with the crystalline ingredient, particle size and I-V curve. Quantitative analysis and corresponding formula expression between the capacitance and the measured I-V curve is given, and a proper range of scan speed for accurate measuring the efficiency of DSSC is suggested. It is found the traditional I-V measurement method is limited in the measurement of dye-sensitized solar cells (DSSCs). Experiments showed that, the scan speed in this method influences the measured DSSCs' efficiency value greatly, while none such impact was found in that of Si cell. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1551 / 1555
页数:5
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