Electromagnetic Analysis, Deciphering and Reverse Engineering of Integrated Circuits (E-MATA HARI)

被引：0

作者：

Chusseau, Laurent ^{[1
]}

Omarouayache, Rachid ^{[1
]}

Raoult, Jeremy ^{[1
]}

Jarrix, Sylvie ^{[1
]}

Maurine, Philippe ^{[2
,6
]}

Tobich, Karim ^{[2
]}

Boyer, Alexandre ^{[3
]}

Vrignon, Bertrand ^{[4
]}

Shepherd, John ^{[4
]}

Thanh-Ha Le ^{[5
]}

Berthier, Mael ^{[5
]}

Riviere, Lionel ^{[5
]}

Robisson, Bruno ^{[6
]}

Ribotta, Anne-Lise ^{[7
]}

机构：

[1] Univ Montpellier 2, IES, F-34095 Montpellier, France

[2] Univ Montpellier 2, LIRMM, F-34095 Montpellier, France

[3] LAAS, CNRS, F-31077 Toulouse, France

[4] Freescale Semicond Inc, F-31023 Toulouse, France

[5] Safran Morpho, F-95523 Osny, France

[6] CEA Leti, F-13541 Gardanne, France

[7] ENSMSE, F-13541 Gardanne, France

来源：

2014 22ND INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION (VLSI-SOC) | 2014年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electromagnetic fault injections are produced on secured ICs aiming to break crypto codes. We describe in this paper the whole chain of optimization necessary to achieve this goal, namely 1/ physical optimization of near-field probe and setup, 2/ signal management in timing, shape, and localization to induce the fault while beating countermeasures and 3/ understanding of fault propagation in logic to eventually protect future ICs.

引用

页数：6

共 36 条

[1] An Electromagnetic Imaging Technique for Reverse Engineering of Integrated Circuits
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[2] Reverse Engineering of CMOS Integrated Circuits
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[8] Analysis of a test setup for the characterization of integrated circuits electromagnetic emissions
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[9] Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits
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[10] Analysis of Electromagnetic Information Leakage Based on Cryptographic Integrated Circuits
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