Additive-subtractive phase-modulated speckle interferometry: Fringe visibility under partial decorrelation

被引:4
|
作者
Krishnaswamy, S
Pouet, BF
Chatters, TC
机构
[1] Idaho Natl. Engineering Laboratory, Idaho Falls
[2] Ctr. Qual. Eng. and Failure Prev., Northwestern University, Evanston
关键词
D O I
10.1016/0143-8166(95)00112-3
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Additive-subtractive phase modulated speckle interferometry (ASPM-SI) is a technique that minimizes the susceptibility of speckle methods to environmental noise while providing fringes of good visibility. The method requires the acquisition of two consecutive video frames of additive-speckle images of the same two deformed states of an object at a rapid enough rate such that ambient noise is not a problem. The additive-speckle images as expected are of very poor visibility due to the presence of the self-interference term. An interframe phase-modulation is introduced and the two additive-speckle images are digitally subtracted to improve the fringe visibility by removing the self-interference term. The ASPM-SI method works with in-plane and out-of-plane deformation sensitive ESPI as well as with displacement-gradient sensitive speckle-shearing interferometry. It is shown that the ASPM-SI scheme has higher visibility than conventional additive-SI and performs consistently better than subtractive-SI schemes in the presence of partial interframe speckle decorrelating optical noise. Furthermore, it is shown that the fringe visibility of the out-of-plane displacement sensitive interferometer which uses a protected reference beam separate from the object beam can be made to be essentially unity even at complete interframe decorrelation. Copyright (C) 1996 Elsevier Science Ltd.
引用
收藏
页码:179 / 197
页数:19
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