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- [2] Strain and Residual Stress Analysis on Technical Components using X-Rays, Synchrotron X-Rays and Neutrons [J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2000, 56 : S158 - S158
- [5] Scattering of X-Rays and Synchrotron Radiation by Porous Semiconductor Structures [J]. METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2010, 32 (01): : 41 - 49
- [7] Diffraction measurements of residual macrostress and microstress using X-rays, synchrotron and neutrons [J]. 1600, 252-263 (July 2004):
- [9] EXAMINING CATALYSTS USING X-RAYS FROM SYNCHROTRON-RADIATION [J]. CHEMISTRY & INDUSTRY, 1995, (04) : 135 - 138