Impact factor for the ionospheric total electron content response to solar flare irradiation

On the basis of ionospheric total electron content (TEC) enhancement over the subsolar region during flares, and combined with data of the peak X-ray flux in the 0.1-0.8 nm region, EUV increase in the 0.1-50 and 26-34 nm regions observed by the SOHO Solar EUV Monitor EUV detector, also with the flare location on the solar disc, the relationship among these parameters is analyzed statistically. Results show that the correlation between ionospheric TEC enhancement and the soft X-ray peak flux in the 0.1-0.8 nm region is poor, and the flare location on the solar disc is one noticeable factor for the impact strength of the ionospheric TEC during solar flares. Statistics indicate clearly that, at the same X-ray class, the flares near the solar disc center have much larger effects on the ionospheric TEC than those near the solar limb region. For the EUV band, although TEC enhancements and EUV flux increases in both the 0.1-50 and 26-34 nm regions have a positive relation, the flux increase in the 26-34 nm region during flares is more correlative with TEC enhancements. Considering the possible connection between the flare location on the solar disc and the solar atmospheric absorption to the EUV irradiation, an Earth zenith angle is introduced, and an empirical formula describing the relationship of TEC enhancement and traditional flare parameters, including flare X-ray peak and flare location information, is given. In addition, the X-ray class of the flare occurring on 4 November 2003, which led the saturation of the X-ray detector on GOES 12, is estimated using this empirical formula, and the estimated class is X44.