A ferromagnetic resonance study of NiFe alloy thin films

被引：36
|
作者：
Díaz de Sihues, M. [1 ]
Durante-Rincón, C. A. [1 ]
Fermin, J. R. [1 ]
机构：
[1] Univ Zulia, Fac Ciencias, Dept Fis, Zulia 4001, Venezuela
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2007年 / 316卷 / 02期
关键词：
magnetic thin film; magnetic anisotropy; ferromagnetic resonance; angular dispersion;
D O I：
10.1016/j.jmmm.2007.02.181
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
NiFe alloy films with thicknesses in the range from 60 to 150 angstrom were sputtered onto Si ( 0 0 1) wafers by DC magnetron sputtering, and then characterized by in-plane ferromagnetic resonance technique ( FMR) at x-band. The FMR field ( H-R) and linewidth ( DH) were studied as a function of the in-plane angle, phi(H) film thickness, t, and temperature, T. The main effects of temperature on the magnetic properties of these. lms is to increase the in-plane uniaxial anisotropy and to induce a surface anisotropy that pushes the magnetization out-of-plane. These anisotropies were found to vary with thickness and temperature. The main processes that determine the line broadening are the intrinsic conduction mechanism and the in-plane uniaxial dispersions. (c) 2007 Elsevier B. V. All rights reserved.
引用
收藏
页码：E462 / E465
页数：4
相关论文
共 50 条
  • [1] Thickness Dependence of Ferromagnetic Resonance Properties in NiFe Thin Films
    Kim, Dong Young
    Yoon, Seok Soo
    [J]. JOURNAL OF THE KOREAN MAGNETICS SOCIETY, 2013, 23 (02): : 37 - 42
  • [2] Ferromagnetic Resonance Study on Si/NiO/NiFe Films
    Sun, Ke
    Yang, Yan
    Liu, Yu
    Yu, Zhong
    Zeng, Yuqin
    Tong, Wei
    Jiang, Xiaona
    Lan, Zhongwen
    Guo, Rongdi
    Wu, Chuanjian
    [J]. IEEE TRANSACTIONS ON MAGNETICS, 2015, 51 (11)
  • [3] Brillouin light scattering and ferromagnetic resonance in sputtered NiFe/Cu/NiFe thin films
    Lucena, MA
    deAguiar, FM
    Rezende, SM
    Azevedo, A
    Chesman, C
    Parkin, SSP
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 81 (08) : 4770 - 4772
  • [4] A STUDY OF FERROMAGNETIC RESONANCE IN THIN MAGNETIC FILMS
    HOPER, JH
    [J]. IEEE TRANSACTIONS ON MAGNETICS, 1969, MAG5 (03) : 484 - &
  • [5] FERROMAGNETIC RESONANCE IN THIN FERROMAGNETIC FILMS
    SOKOLOV, VM
    [J]. SOVIET PHYSICS SOLID STATE,USSR, 1968, 9 (11): : 2649 - +
  • [6] Ferromagnetic resonance study of polycrystalline Fe1-xVx alloy thin films
    Beaujour, J. -M. L.
    Kent, A. D.
    Abraham, D. W.
    Sun, J. Z.
    [J]. JOURNAL OF APPLIED PHYSICS, 2008, 103 (07)
  • [7] Ferromagnetic resonance study of sputtered NiFe/V/NiFe heterostructures
    Alayo, W.
    Pelegrini, F.
    Baggio-Saitoyitch, E.
    [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2015, 377 : 104 - 110
  • [8] MICROWAVE RESONANCE IN THIN FERROMAGNETIC FILMS
    TANNENWALD, PE
    SEAVEY, MH
    [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1959, 20 (2-3): : 323 - 326
  • [9] FERROMAGNETIC RESONANCE IN NISN THIN FILMS
    INTA, I
    BAICAN, R
    [J]. REVUE ROUMAINE DE PHYSIQUE, 1969, 14 (07): : 673 - &
  • [10] Ferromagnetic Resonance in Magnetite Thin Films
    Nagata, Masaki
    Tanabe, Kenji
    Moriyama, Takahiro
    Chiba, Daichi
    Ohe, Jun-Ichiro
    Myoka, Makoto
    Niizeki, Tomohiko
    Yanagihara, Hideto
    Kita, Eiji
    Ono, Teruo
    [J]. IEEE TRANSACTIONS ON MAGNETICS, 2014, 50 (01)
12345