Measurement of the mid-infrared emission spectrum of diamond

被引：0
|
作者：
Powell, GL [1 ]
Cox, RL [1 ]
Allison, SW [1 ]
机构：
[1] Oak Ridge Ctr Mfg Technol, Oak Ridge, TN 37831 USA
来源：
FOURIER TRANSFORM SPECTROSCOPY | 1998年 / 430期
关键词：
D O I：
10.1063/1.55720
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A method for measuring the emission spectra of diamond wafers, typically 0.1 to 1 mm thick, is described. The method uses a 40 W continuous CO laser (1800 cm(-1) to 1900 cm(-1)) to heat the diamond to similar to 500 degrees C suspended in an evacuable cell in an emission collection accessory to a Fourier transform infrared spectrometer (FTIRS). A shutter protects the FTIRS from the intense laser light during the heating process and opens immediately after the laser is turned off to measure the emission as the specimen cools. The spectra are referenced to a "black body" source that uses the same evacuable cell window. Data from synthetic and natural diamonds are reported.
引用
收藏
页码：526 / 528
页数：3
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