Electrical characteristics of conjugated self-assembled monolayers in large-area molecular junctions

被引：31
|
作者：
Kronemeijer, A. J. [1 ]
Huisman, E. H. [1 ]
Akkerman, H. B. [1 ]
Goossens, A. M. [1 ]
Katsouras, I. [1 ]
van Hal, P. A. [2 ]
Geuns, T. C. T. [2 ]
van der Molen, S. J. [3 ]
Blom, P. W. M. [1 ,4 ]
de Leeuw, D. M. [1 ,2 ]
机构：
[1] Univ Groningen, Zernike Inst Adv Mat, NL-9747 AG Groningen, Netherlands
[2] Philips Res Labs, NL-5656 AE Eindhoven, Netherlands
[3] Leiden Univ, Kamerlingh Onnes Lab, NL-2333 CA Leiden, Netherlands
[4] TNO Holst Ctr, NL-5605 KN Eindhoven, Netherlands
来源：
APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 17期
关键词：
ATOMIC-FORCE MICROSCOPY; SINGLE-MOLECULE; LENGTH DEPENDENCE; PHENYLENE OLIGOMERS; CONTACT RESISTANCE; CONDUCTANCE; WIRES; TRANSPORT; THIOLS;
D O I：
10.1063/1.3503607
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have studied the electrical characteristics of close-packed monolayers of conjugated para-phenylene oligomers as a function of molecular length in large-area molecular junctions. An exponential increase in resistance with molecular length is observed, R proportional to exp(beta L), with beta = 0.26 +/- 0.04 angstrom(-1) and beta = 0.20 +/- 0.06 angstrom(-1) for dithiol and monothiol derivatives, respectively. The decay coefficients are lower than previously determined experimentally using scanning probe or breakjunction techniques. We tentatively explain the low values by the forced planer geometry of the self-assembled molecules. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3503607]
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页数：3
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