Nanoscale Measurements of Charge Transfer at Cocatalyst/ Semiconductor Interfaces in BiVO4 Particle Photocatalysts

被引:10
|
作者
Boettcher, Shannon W. [1 ,2 ]
Shen, Meikun [1 ,2 ]
Kaufman, Aaron J. [1 ,2 ]
Huang, Jiawei [1 ,2 ]
Price, Celsey [1 ,2 ]
机构
[1] Univ Oregon, Dept Chem & Biochem, Eugene, OR 97403 USA
[2] Univ Oregon, Oregon Ctr Electrochem, Eugene, OR 97403 USA
关键词
photocatalysis; atomic force microscopy; interface; selectivity; electrocatalyst; semiconductor; OXYGEN-EVOLUTION ELECTROCATALYSTS; QUANTUM EFFICIENCY; DIFFERENT FACETS; REDUCTION;
D O I
10.1021/acs.nanolett.2c03592
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Semiconductor photocatalyst particles convert solar energy to fuels like H2. The particles are often assumed to provide crystalline-facet-dependent electron-hole separation. A common strategy is to deposit a hydrogen evolution reaction (HER) electrocatalyst on electron-selective facets and an oxygen evolution reaction (OER) electrocatalyst on hole-selective facets. A precise understanding of how charge-carrier-selective contacts emerge and how they are rationally designed, however, is missing. Using a combination of ex situ and in situ conducting atomic force microscopy (AFM) experiments and new ionomer/catalyst-semi-conductor test structures, we show how heterogeneity in charge carrier selectivity can be measured at the nanoscale. We discover that the presence of the water/electrolyte interface is critical to induce hole selectivity between the CoOx water-oxidation catalyst and the BiVO4 light absorber. pH-dependent measurements suggest that negative surface charge on the semiconductor is central to inducing hole selectivity. The work also demonstrates a new approach to control local pH and introduce water using thin-film ionomers compatible with conductive AFM measurements.
引用
收藏
页码:9493 / 9499
页数:7
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