Open Series Fault Comparison in AC & DC Micro-grid Architectures

被引:0
|
作者
Estes, H. B. [1 ]
Kwasinski, A. [1 ]
Hebner, R. E. [1 ]
Uriarte, F. M. [1 ]
Gattozzi, A. L. [1 ]
机构
[1] Univ Texas Austin, Ctr Electromech, Dept Elect & Comp Engn, Austin, TX 78758 USA
关键词
direct current; open series fault; arc transient; spike; current interruption; micro-grid;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper explores empirical observations of open series fault (arc fault) testing during current interruptions. Emphasis is on dc systems, but arc behavior is also compared to that of ac systems under "quasi-equivalent" circuit parameters. Specific parameters that are considered regarding arc behavior include gap voltage, current, dissipated power, voltage and current transient characteristics, reignition, bus disturbances, and contact position during dc arc collapse. Based on these results, comparisons between ac and dc systems seem to indicate that different arc-related challenges exist for both dc and ac architectures.
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页数:6
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