Piezoelectric properties of microfabricated (K,Na)NbO3 thin films

被引:20
|
作者
Wakasa, Yu [1 ]
Kanno, Isaku [1 ]
Yokokawa, Ryuji [1 ]
Kotera, Hidetoshi [1 ]
Shibata, Kenji [2 ]
Mishima, Tomoyoshi [2 ]
机构
[1] Kyoto Univ, Sakyo Ku, Kyoto 6068501, Japan
[2] Hitachi Cable Ltd, Res & Dev Lab, Tsuchiura, Ibaraki, Japan
关键词
KNN; Piezoelectric; Thin films; Microfabrication; MEMS; ETCHING CHARACTERISTICS; CERAMICS;
D O I
10.1016/j.sna.2011.06.018
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel microfabrication method of lead-free piezoelectric sodium potassium niobate [(K,Na)NbO3, KNN] thin films was proposed, and the piezoelectric characteristics of the KNN microactuators were evaluated. The KNN thin films were directly deposited on microfabricated Si microcantilevers. The transverse piezoelectric coefficient d(31) of the KNN films was calculated as -53.5 pm/V at 20 V-pp from the tip displacement of the microcantilevers. However, the tip displacement showed large electric-field dependence because of the extrinsic piezoelectric effect, and the intrinsic piezoelectric effect of the KNN microcantilevers was smaller than that of KNN on unprocessed thick substrates. In contrast, the extrinsic piezoelectric effect was almost independent of the microfabrication of the KNN films. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:223 / 227
页数:5
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