On-chip IDDQ testing in the AE11 fail-stop controller

被引：2

作者：

Bohl, E ^{[1
]}

Lindenkreuz, T ^{[1
]}

Meerwein, M ^{[1
]}

机构：

[1] Robert Bosch Co, Stuttgart, Germany

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1998年 / 15卷 / 04期

关键词：

D O I：

10.1109/54.735928

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Targeted for safety-critical applications, this microcontroller replaces the classic two-controller safety structure with a single controller containing various online fault detection measures. To minimize chip area without reducing safety, the developers incorporated a combination of concurrent checking, BIST, and I-DDQ testing- and considerably extended the standard cell-based design flow.

引用

页码：57 / 65

页数：9