Cross calibration of new x-ray films against direct exposure film from 1 to 8 keV using the X-pinch x-ray source

被引:22
|
作者
Chandler, KM [1 ]
Pikuz, SA
Shelkovenko, TA
Mitchell, MD
Hammer, DA
Knauer, JP
机构
[1] Cornell Univ, Plasma Studies Lab, Ithaca, NY 14853 USA
[2] Univ Rochester, Laser Energet Lab, Rochester, NY 14623 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2005年 / 76卷 / 11期
关键词
D O I
10.1063/1.2135276
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A cross calibration of readily available x-ray sensitive films has been carried out against the calibrated direct exposure film (DEF) which is no longer being manufactured by Kodak. Four-wire X pinches made from various metal wires were used as x-ray sources for this purpose. Tests were carried out for the Kodak films Biomax MS, Biomax XAR, M100, Technical Pan, and T-Max over the energy range of 1-8 keV (12.4-1.5 A wavelength). The same hand-development procedures as described by Henke [J. Opt. Soc. Am. B 3, 1540 (1986)] were followed for all films in every test. Sensitivity curves as a function of wavelength for these films relative DEF are presented. These relative calibrations show that Biomax MS is likely to be the best replacement film for DEF for most purposes over the energy range tested here. (c) 2005 American Institute of Physics.
引用
收藏
页码:1 / 8
页数:8
相关论文
共 50 条
  • [1] X-PINCH A POINT X-RAY SOURCE
    GARG, AB
    ROUT, RK
    SHYAM, A
    SRINIVASAN, M
    [J]. INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1995, 33 (06) : 329 - 331
  • [2] X-ray backlighting using an X-pinch
    Zhang, Ran
    Zhao, Tong
    Zou, Xiaobing
    Wang, Xinxin
    Zhao, Yongchao
    Du, Yanqiang
    Wang, Lianhui
    [J]. Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams, 2010, 22 (04): : 931 - 935
  • [3] Temporal parameters of the X-pinch x-ray source
    Sinars, DB
    Pikuz, SA
    Shelkovenko, TA
    Chandler, KM
    Hammer, DA
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (07): : 2948 - 2956
  • [4] Characteristics of a molybdenum X-pinch X-ray source as a probe source for X-ray diffraction studies
    Zucchini, F.
    Bland, S. N.
    Chauvin, C.
    Combes, P.
    Sol, D.
    Loyen, A.
    Roques, B.
    Grunenwald, J.
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2015, 86 (03):
  • [5] Timing of x-ray burst from X-pinch
    Zhao, Shen
    Zhang, Ran
    Zhu, Xinlei
    Zou, Xiaobing
    Wang, Xinxin
    [J]. PHYSICS OF PLASMAS, 2015, 22 (06)
  • [6] On the Size of the Soft X-Ray Radiation Source Based on an X-Pinch
    Artyomov, A. P.
    Chaikovsky, S. A.
    Oreshkin, V. I.
    Fedunin, A. V.
    Rousskikh, A. G.
    Ratakhin, N. A.
    [J]. RUSSIAN PHYSICS JOURNAL, 2020, 62 (12) : 2194 - 2203
  • [7] On the Size of the Soft X-Ray Radiation Source Based on an X-Pinch
    A. P. Artyomov
    S. A. Chaikovsky
    V. I. Oreshkin
    A. V. Fedunin
    A. G. Rousskikh
    N. A. Ratakhin
    [J]. Russian Physics Journal, 2020, 62 : 2194 - 2203
  • [8] X-Ray Emission From a Tabletop X-Pinch Device
    Zhang, Ran
    Zou, Xiaobing
    Zhu, Xinlei
    Zhao, Shen
    Luo, Haiyun
    Wang, Xinxin
    [J]. IEEE TRANSACTIONS ON PLASMA SCIENCE, 2012, 40 (12) : 3354 - 3359
  • [9] X-ray emission from an X-pinch and its applications
    Liu, R.
    Zou, X.
    Wang, X.
    Zeng, N.
    He, L.
    [J]. LASER AND PARTICLE BEAMS, 2008, 26 (03) : 455 - 460
  • [10] X-Pinch And Its Applications In X-ray Radiograph
    Zou, Xiaobing
    Wang, Xinxin
    Liu, Rui
    Zhao, Tong
    Zeng, Naigong
    Zhao, Yongchao
    Du, Yanqiang
    [J]. FRONTIERS IN PHYSICS-BOOK, 2009, 1150 : 168 - 173