Fibre-top atomic force microscope probe with optical near-field detection capabilities

被引：9

作者：

Tiribilli, B. ^{[3
]}

Margheri, G. ^{[3
]}

Baschieri, P. ^{[4
]}

Menozzi, C. ^{[5
,6
]}

Chavan, D. ^{[1
,2
]}

Iannuzzi, D. ^{[1
,2
]}

机构：

[1] Vrije Univ Amsterdam, Dept Phys & Astron, Amsterdam, Netherlands

[2] Vrije Univ Amsterdam, LaserLaB Amsterdam, Amsterdam, Netherlands

[3] CNR, Inst Complex Syst, Sesto Fiorentino, Italy

[4] CNR, Natl Opt Inst, Pisa, Italy

[5] Univ Modena & Reggio Emilia, Dept Phys, Modena, Italy

[6] CNR Ist Nanosci, Ctr S3, Modena, Italy

来源：

JOURNAL OF MICROSCOPY | 2011年 / 242卷 / 01期

基金：

欧洲研究理事会;

关键词：

AFM; fibre-top technology; SNOM; NSOM; TIPS;

D O I：

10.1111/j.1365-2818.2010.03476.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

P>We present a fibre-top probe fabricated by carving a tipped cantilever on an optical fibre, with the tip machined in correspondence of the fibre core. When approached to an optical prism illuminated under total internal reflection conditions, the tip of the cantilever detects the optical tunnelling signal, while the light coupled from the opposite end of the fibre measures the deflection of the cantilever. Our results suggest that fibre-top technology can be used for the development of a new generation of hybrid probes that can combine atomic force microscopy with scanning near field optical microscopy.

引用

页码：10 / 14

页数：5

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