Measurement of lateral current redistribution of fault current limiter using YBCO thin film

被引：8

作者：

Miyashita, M ^{[1
]}

Umeda, S

Nagao, S

Amemiya, N

Kubota, H

Kudo, Y

Inoue, K

机构：

[1] Yokohama Natl Univ, Fac Engn, Yokohama, Kanagawa 2408501, Japan

[2] Toshiba Co Ltd, Corp R&D Ctr, Kawasaki, Kanagawa 218582, Japan

[3] Super GM, Osaka 5300047, Japan

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2005年 / 15卷 / 02期

关键词：

current redistribution; fault current limiter; pick-up coil; superconductor; YBCO;

D O I：

10.1109/TASC.2005.849442

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The current redistribution during the limiting phase of a FCL element using YBCO thin film was studied. The FCL element which we have been studying consists of YBCO thin film and nickel film shunt resistor and they are connected in parallel by indium bridges. When a normal zone appears in YBCO thin film due to the over-current, the current transfers from YBCO thin film to nickel film shunt resistor through indium bridges. We measured the change in the distribution of magnetic flux produced by the current carried by the FCL element using an array of pick-up coils. From the pick-up coil signals, the change in the lateral current distribution in the FCL element was calculated assuming an electrical circuit model of the FCL element.

引用

页码：2023 / 2026

页数：4

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