Bus emulation techniques enhance functional testing

被引：0
|
作者：
Rivera, J [1 ]
机构：
[1] Geotest Marvin Test Syst, Irvine, CA 92614 USA
来源：
EE-EVALUATION ENGINEERING | 2003年 / 42卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
With the right mix of digital I/O hardware and software, bus emulation handles just about anything functional test demands.
引用
收藏
页码：20 / +
页数：4
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