Towards automated test program development with integrated reliability model for electronics used in aerospace and defense ATS applications

The paper describes an approach to the automatic test systems with integrated reliability model to facilitate and improve the development and maintenance processes for automated test programs. Such approach will have defined XML schemas for unit under test consisting of "generic" components having a minimum set of electrical and thermal characteristics already developed under some accepted standards. A corresponding design tool, referenced in this paper as operational mode forms, along with its data entry interface developed for the unit under test design environment is presented within the integrated reliability model framework as well.