Single reflection method for pole-density measurements accounting for secondary extinction in textured films

被引：0

作者：

Tomov, I ^{[1
]}

机构：

[1] Bulgarian Acad Sci, Inst Phys Chem, BU-1113 Sofia, Bulgaria

来源：

EUROPEAN POWDER DIFFRACTION EPDIC 8 | 2004年 / 443-4卷

关键词：

extinction; films; pole density; silver; texture; X-ray diffraction;

D O I：

10.4028/www.scientific.net/MSF.443-444.141

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

A method of pole density measurements is described, which uses the differences in X-ray beam polarisation of two monochromators. The method requires a single reflection at an intermediate diffraction angle. Experimental verification is provided by pole density measurements of Ag films and comparison the results obtained with the proposed method with results from the reflection-pair method [8-10].

引用

页码：141 / 144

页数：4

共 44 条

[1] Secondary extinction used in thickness and pole density measurements of textured films by X-ray diffraction
Tomov, I
TEXTURE AND ANISOTROPY OF POLYCRYSTALS, 1998, 273-2 : 145 - 150
[2] Secondary extinction in textured films
Yamakov, V
Tomov, I
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1999, 32 : 300 - 308
[3] X-ray diffraction characterization of textured films accounting for secondary extinction
Tomov, I
Yamakov, V
EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2000, 321-3 : 137 - 142
[4] X-ray diffraction characterization of textured films accounting for secondary extinction
Tomov, I., 2000, Trans Tech Publ, Uetikon-Zuerich, Switzerland (321)
[5] Thickness measurement of thin textured films by a novel X-ray diffraction method accounting for secondary extinction
Tomov, I.
Vassilev, S.
APPLIED CRYSTALLOGRAPHY XX, 2007, 130 : 43 - +
[6] The Precision of XRD Apparatus Can Be Assessed by Accounting for Secondary Extinction of a Single Reflection
Tomov, Ivan
Vassilev, Sasho
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2009, 65 : S333 - S333
[7] Anisotropy of secondary extinction coefficient in textured films
Tomov, I
EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2001, 378-3 : 192 - 197
[8] Eliminating the extinction-induced reflection enlargement in the XRD characterisations of textured films
Tomov, I
MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 2003, 34 (07) : 688 - 692
[9] An extinction-free technique for pole density measurements of textures by XRD
Tomov, I.
Vassilev, S.
Avdeev, G.
BULGARIAN CHEMICAL COMMUNICATIONS, 2011, 43 (02): : 334 - 338
[10] Secondary extinction correction used in a novel method for improved XRD characterizations of textured materials: The case of thin films
Tomov, I.
ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2007, : 131 - 136

← 1 2 3 4 5 →