Propagation of a Gaussian beam through a stack of positive and negative refractive index materials

被引：0
|
作者：
Ghosh, Anjan [1 ]
Verma, Pramode [1 ]
Banerjee, Partha P. [2 ]
Aylo, Rola [2 ]
机构：
[1] Univ Oklahoma, Sch ECE, Tulsa, OK 74135 USA
[2] Univ Dayton, Dept ECE, Dayton, OH USA
来源：
METAMATERIALS: FUNDAMENTALS AND APPLICATIONS III | 2010年 / 7754卷
关键词：
Metamaterials; Stack; Gaussian beam propagation; Ray optics; Nanophotonic sensors;
D O I：
10.1117/12.861948
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Propagation of a monochromatic Gaussian beam through a stack of alternating layers of positive-refractive-index dielectrics and negative-refractive-index metamaterials is analyzed using paraxial ray-optics approach. Expressions for the change of the spot-size of the Gaussian beam are derived. Sensors for measuring parameters that affect the thickness or refractive index of the metamaterials can be developed based on the change of the spot-size.
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页数：6
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