Characteristic analysis of coupled microstrip patch resonators on ferrimagnetic substrates

被引:0
|
作者
Sun, KQ
Chen, YC
Barry, W
Corlett, J
机构
[1] UNIV HONG KONG,DEPT EE,HONG KONG,HONG KONG
[2] LAWRENCE BERKELEY LAB,CTR BEAM PHYS,BERKELEY,CA 94720
关键词
D O I
10.1063/1.362234
中图分类号
O59 [应用物理学];
学科分类号
摘要
This paper is to use the spectral-domain technique to perform characteristic analysis of coupled microstrip patch resonators on ferrimagnetic substrates. Our formulation has been validated by comparing our result with the published data and showing an excellent agreement between them. Numerical computations have been performed to obtain dependence of resonant frequency on patch dimensions, offset and separation between the two patches, thicknesses of ferrimagnetic film and substrate. It has been seen that as the length of the patch increases the resonant frequency decreases. The larger the offset between the two patches the lower the resonant frequency. The separation between the two patches strongly affects the resonant frequency. It is also found that the resonant frequency increases as the width of the patch decreases. For the fixed dimensions, separation and offset, a thinner substrate results in a higher resonant frequency, and in contrast, a thinner ferrimagnetic film results in a lower resonant frequency. (C) 1996 American Institute of Physics.
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页码:5733 / 5735
页数:3
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