Characterization of the Optical Properties of GaN:Fe for High Voltage Photoconductive Switch Applications

被引:0
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作者
Meyers, V. [1 ]
Mauch, D. [1 ]
Mankowski, J. [1 ]
Dickens, J. [1 ]
Neuber, A. [1 ]
机构
[1] Texas Tech Univ, Dept Elect & Comp Engn, Ctr Pulsed Power & Power Elect, 2500 Broadway,Mail Stop 3102, Lubbock, TX 79409 USA
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The optical properties of bulk semi-insulating GaN:Fe are obtained to assess its future suitability as a high voltage photoconductive semiconductor switch (PCSS). The material properties of GaN: Fe hold significant promise to improve devices for pulsed power and other applications. Growth techniques of bulk GaN: Fe, which have hitherto been largely insufficient for commercial applications, are nearing the point that anticipatory characterization research is warranted. In this paper, the optical constants of bulk GaN: Fe (refractive index, absorption coefficient, and off-state dielectric function) were determined by optical reflection/transmission analysis. The results of this analysis are compared with a similar treatment of bulk 4H-SiC as well as possible elements of PCSS housing: Sylgard 184 elastomer, and EFI 20003/50013 electrical potting epoxy. The data presented provide foundational material characterization to enable assessment of the feasibility of GaN: Fe as a practical high voltage PCSS material. Beyond basic materials research, these properties inform design optimization in PCSS construction and implementation.
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页数:4
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