GaN-on-diamond technology platform: Bonding-free membrane manufacturing process

被引:23
|
作者
Smith, Matthew D. [1 ]
Cuenca, Jerome A. [2 ]
Field, Daniel E. [3 ]
Fu, Yen-chun [1 ]
Yuan, Chao [3 ]
Massabuau, Fabien [4 ]
Mandal, Soumen [2 ]
Pomeroy, James W. [3 ]
Oliver, Rachel A. [4 ]
Uren, Michael J. [3 ]
Elgaid, Khaled [2 ]
Williams, Oliver A. [2 ]
Thayne, Iain [1 ]
Kuball, Martin [3 ]
机构
[1] Univ Glasgow, Sch Engn, Glasgow G12 8LT, Lanark, Scotland
[2] Cardiff Univ, Sch Engn, Cardiff CF24 3AA, Wales
[3] Univ Bristol, HH Wills Phys Lab, CDTR, Bristol BS8 1TL, Avon, England
[4] Univ Cambridge, Dept Mat Sci & Met, 27 Charles Babbage Rd, Cambridge CB3 0FS, England
基金
英国工程与自然科学研究理事会;
关键词
ALGAN;
D O I
10.1063/1.5129229
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
GaN-on-diamond samples were demonstrated using a membrane-based technology. This was achieved by selective area Si substrate removal of areas of up to 1 cm x 1 cm from a GaN-on-Si wafer, followed by direct growth of a polycrystalline diamond using microwave plasma chemical vapor deposition on etch exposed N-polar AlN epitaxial nucleation layers. Atomic force microscopy and transmission electron microscopy were used to confirm the formation of high quality, void-free AlN/diamond interfaces. The bond between the III-nitride layers and the diamond was validated by strain measurements of the GaN buffer layer. Demonstration of this technology platform is an important step forward for the creation of next generation high power electronic devices. (c) 2020 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
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页数:5
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