A SAT method for improving test pattern generation

被引：0
|
作者：
Liu Xin [1 ]
Xiong Youlun [2 ]
机构：
[1] Hubei Univ Technol, Sch Elect & Elect Engn, Wuhan 430068, Peoples R China
[2] Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, Wuhan 430074, Peoples R China
来源：
ICEMI 2007: PROCEEDINGS OF 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOL I | 2007年
基金：
中国国家自然科学基金;
关键词：
test pattern generation; fault detection; Boolean satisfiability; BDD;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：398 / 403
页数：6
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