Enhanced Anti-reflective Coating for Thin Film Solar Cells

被引：0

作者：

Rajan, Grace ^{[1
]}

Karki, Shankar ^{[1
]}

Collins, Robert W. ^{[2
]}

Marsillac, Sylvain ^{[1
]}

机构：

[1] Old Dominion Univ, Virginia Inst Photovolta, Norfolk, VA 23529 USA

[2] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA

来源：

2017 IEEE 44TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC) | 2017年

关键词：

CIGS; AR coating; ellipsometry; optical modeling; photovoltaic cells;

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

In this paper, we describe a modified anti-reflective (AR) coating to enhance the efficiency of Cu(In1-x Ga-x)Se-2 (CIGS) solar cells. The process is designed using in-situ real time spectroscopic ellipsometry and optical modeling allowing for the optimization of the properties of the AR coating. The optical model developed is based on a transfer matrix as well as accurate measurement of the dielectric function and thickness of each layer in the stack by spectroscopic ellipsometry. We demonstrate the influence of the substrate temperature on the properties of the AR coating, which can provide an increase in the short circuit current density by up to 10%.

引用

页码：807 / 809

页数：3

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