Using real-time data analysis to conduct next-generation synchrotron fatigue studies

被引:2
|
作者
Shadle, D. J. [1 ]
Miller, M. P. [1 ,2 ]
Nygren, K. E. [1 ,2 ]
机构
[1] Cornell Univ, Sibley Sch Mech & Aerosp Engn, Ithaca, NY 14850 USA
[2] Cornell Univ, Cornell High Energy Synchrotron Source, Ithaca, NY 14850 USA
基金
美国国家科学基金会;
关键词
Low cycle fatigue; Synchrotron X-ray diffraction; Mathematical analysis; Micromechanics; X-RAY-DIFFRACTION; DEFORMATION HETEROGENEITY; INDIVIDUAL GRAINS; DISTRIBUTIONS; ORIENTATION; STRAINS; STRESS; PLANES; SLIP;
D O I
10.1016/j.ijfatigue.2022.107113
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Next-generation experimental techniques, like high energy X-ray diffraction microscopy (HEDM), usher in new opportunities to collect the grain-scale data necessary for understanding the evolving processes that drive fatigue failure. In this study, we present a framework for monitoring the evolution of a deforming polycrystal, in real-time, by applying principal component analysis (PCA) to raw X-ray diffraction image data. We applied this framework to inform in-situ HEDM measurements of a cyclically loaded Inconel-718 superalloy. We discovered correlations between PCA of the diffraction data and the physical processes in the polycrystal. Lastly, we discuss extending this framework in future HEDM fatigue studies.
引用
收藏
页数:17
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