Atomic-scale Study of Scattering and Electronic Properties of CVD Graphene Grain Boundaries

被引:0
|
作者
Koepke, Justin C. [1 ]
Wood, Joshua D. [2 ]
Estrada, David [1 ,3 ]
Ong, Zhun-Yong [4 ,5 ]
Xiong, Feng [3 ]
Pop, Eric [2 ]
Lyding, Joseph W. [2 ]
机构
[1] Univ lIIinois Urbana Champaign, Dept Elect & Comp Engn, Urbana, IL 61801 USA
[2] Univ lIIinois Urbana Champaign, Dept Elect & Comp Engn, Beckman Inst Adv Sci & Technol, Micro & Nanotechnol Lab, Urbana, IL 61801 USA
[3] Univ lIIinois Urbana Champaign, Dept Elect & Comp Engn, Micro & Nanotechnol Lab, Urbana, IL 61801 USA
[4] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
[5] Univ Texas Richardson, Dept Mat Sci & Engn, Richardson, TX 75080 USA
关键词
CHEMICAL-VAPOR-DEPOSITION; POLYCRYSTALLINE GRAPHENE; COPPER FOILS; GROWTH; FILMS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Chemical vapor deposition growth of graphene on polycrystalline copper foil is a demonstrated technique for obtaining large-area, predominantly monolayer graphene. However, such growth results in grain boundaries between rotationally misoriented graphene grains. We employ scanning tunneling microscopy and spectroscopy to examine the electronic properties of grain boundaries (GBs) and scattering off them in polycrystalline graphene grown by chemical vapor deposition on Cu foil and transferred to SiO2 substrates. Spectroscopy shows enhanced empty states tunneling conductance for most of the GBs and a shift towards more n-type doping compared to the bulk of the graphene. Fourier analysis of the electronic superstructure patterns adjacent to GBs indicates that backscattering and intervalley scattering are the dominant mechanisms, leading to the mobility reduction in the presence of GBs in CVD-grown graphene.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Atomic-Scale Evidence for Potential Barriers and Strong Carrier Scattering at Graphene Grain Boundaries: A Scanning Tunneling Microscopy Study
    Koepke, Justin C.
    Wood, Joshua D.
    Estrada, David
    Ong, Zhun-Yong
    He, Kevin T.
    Pop, Eric
    Lyding, Joseph W.
    [J]. ACS NANO, 2013, 7 (01) : 75 - 86
  • [2] Engineering of atomic-scale flexoelectricity at grain boundaries
    Mei Wu
    Xiaowei Zhang
    Xiaomei Li
    Ke Qu
    Yuanwei Sun
    Bo Han
    Ruixue Zhu
    Xiaoyue Gao
    Jingmin Zhang
    Kaihui Liu
    Xuedong Bai
    Xin-Zheng Li
    Peng Gao
    [J]. Nature Communications, 13
  • [3] Engineering of atomic-scale flexoelectricity at grain boundaries
    Wu, Mei
    Zhang, Xiaowei
    Li, Xiaomei
    Qu, Ke
    Sun, Yuanwei
    Han, Bo
    Zhu, Ruixue
    Gao, Xiaoyue
    Zhang, Jingmin
    Liu, Kaihui
    Bai, Xuedong
    Li, Xin-Zheng
    Gao, Peng
    [J]. NATURE COMMUNICATIONS, 2022, 13 (01)
  • [4] Complex atomic-scale dynamics in grain boundaries in silicon
    Pantelides, ST
    Maiti, A
    Chisholm, M
    Pennycook, SJ
    [J]. DEFECT AND DIFFUSION FORUM, 1998, 156 : 95 - 95
  • [5] Atomic-scale investigation on the structures and mechanical properties of metastable grain boundaries in aluminum
    Liao, Zhuojing
    Zhang, Liang
    Xie, Junjun
    Huang, Xiaoxu
    [J]. Materials Today Communications, 2024, 41
  • [6] Operando atomic-scale study of graphene CVD growth at steps of polycrystalline nickel
    Zou, Zhiyu
    Carnevali, Virginia
    Patera, Laerte L.
    Jugovac, Matteo
    Cepek, Cinzia
    Peressi, Maria
    Comelli, Giovanni
    Africh, Cristina
    [J]. CARBON, 2020, 161 : 528 - 534
  • [7] Electronic properties of graphene grain boundaries
    Ayuela, A.
    Jaskolski, W.
    Santos, H.
    Chico, Leonor
    [J]. NEW JOURNAL OF PHYSICS, 2014, 16
  • [8] Atomic-scale mechanism of grain boundary motion in graphene
    Kim, Dongwook
    Kim, Youngkuk
    Ihm, Jisoon
    Yoon, Euijoon
    Lee, Gun-Do
    [J]. Carbon, 2015, 84 (0C) : 146 - 150
  • [9] Atomic-scale mechanism of grain boundary motion in graphene
    Kim, Dongwook
    Kim, Youngkuk
    Ihm, Jisoon
    Yoon, Euijoon
    Lee, Gun-Do
    [J]. CARBON, 2015, 84 : 146 - 150
  • [10] Atomic-scale mechanism of grain boundary motion in graphene
    Kim, Dongwook
    Kim, Youngkuk
    Ihm, Jisoon
    Yoon, Euijoon
    Lee, Gun-Do
    [J]. Carbon, 2015, 84 (01) : 146 - 150