A simulation-based study on the influence of beam hardening in X-ray computed tomography for dimensional metrology

被引:20
|
作者
Lifton, Joseph J. [1 ]
Malcolm, Andrew A. [2 ]
McBride, John W. [1 ]
机构
[1] Univ Southampton, Electromech Engn Grp, Southampton, Hants, England
[2] Precis Measurements Grp, Singapore Inst Mfg Technol, Singapore, Singapore
关键词
Computed tomography; beam hardening; dimensional metrology; X-ray spectrum estimation; ISO50; surface determination;
D O I
10.3233/XST-140471
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
X-ray computed tomography (CT) is a radiographic scanning technique for visualising cross-sectional images of an object non-destructively. From these cross-sectional images it is possible to evaluate internal dimensional features of a workpiece which may otherwise be inaccessible to tactile and optical instruments. Beam hardening is a physical process that degrades the quality of CT images and has previously been suggested to influence dimensional measurements. Using a validated simulation tool, the influence of spectrum pre-filtration and beam hardening correction are evaluated for internal and external dimensional measurements. Beam hardening is shown to influence internal and external dimensions in opposition, and to have a greater influence on outer dimensions compared to inner dimensions. The results suggest the combination of spectrum prefiltration and a local gradient-based surface determination method are able to greatly reduce the influence of beam hardening in X-ray CT for dimensional metrology.
引用
收藏
页码:65 / 82
页数:18
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