Charge contrast imaging of suspended nanotubes by scanning electron microscopy

被引：20
|
作者：
Finnie, Paul [1 ]
Kaminska, Kate [1 ]
Homma, Yoshikazu [2 ]
Austing, D. Guy [1 ]
Lefebvre, Jacques [1 ]
机构：
[1] Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A OR6, Canada
[2] Tokyo Univ Sci, Dept Phys, Shinjuku Ku, Tokyo 1628601, Japan
来源：
NANOTECHNOLOGY | 2008年 / 19卷 / 33期
关键词：
D O I：
10.1088/0957-4484/19/33/335202
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A method of rapidly identifying and imaging suspended nanotubes by scanning electron microscopy is reported. Nanotubes are visible in high contrast and even at low magnification. The contrast can be explained by considering the effect that the charge on the nanotube has on the substrate. The proposed mechanism is general and should apply to any charged nanostructure in proximity to a surface or interface. This represents a new contrast mechanism in scanning electron microscopy.
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页数：6
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